ATV & PWS in the same chassis
Combined functionality of multiple big-iron testers.
Portable, “bench top” Integrated Circuit (IC) test systems that can test many different part types all from the same tester.
all these part types / one tester
- Memory Tester
- OpAmp Tester / Cmpr Tester
- Mixed Signal Tester
- Shorts-Open Tester
- ASIC [&SOC] Tester
- Curve Tracer
- Discrete Comp Tester
- Logic Circuit Tester
- Power (Reg, FET) Tester
Simple Use: Design and Test in Hours/Days
The ATV/PWS Tester can be configured with analog and digital test cards to create a range of systems to suit various applications with the same capability of with the same capabilities of ‘BIG IRON’ ATE Testers.
JDI family DUT Boards
Standard Test Head
Large High Pin Count Test Head with extraction
Bench Testing, Thermal Testing, Remote Testing
Passive – No Test Head
User Custom DUT Boards
ATV Digital System
The ATV Digital Test System performs high speed testing and timing verification using algorithmically generated test vectors or patterns downloaded from ATPG (Automatic Test Pattern Generation). ATV can be used to test:
- Memories (SRAM, DRAM, FLASH, SDRAM, EEPROM, etc.)
- ASICs
- FPGAs
- PLDs
- Microprocessors
- Systems On a Chip
PWS Analog (I/V) System
The PWS Analog (I/V) Tester (documented in PWS Manual/Help FIle) has built-in switch matrices and precision (picoamp Source Measure Units.) PWS is ideal for testing:
- Transistors
- OpAmps / Comparators
- Simple Shorts/Opens Tests
- Test Structures
- Analog Circuits
Combo: ATV & PWS in same chassis
All the tests provided by either the ATV or the PWS plus: ADCs, DACs, Mixed Signal and more…
The testers can be operated interactively or test sequences can be automated through a built-in BASIC environment. Components can be tested at wafer level or in packages.
They can be remotely tested at distances up to 100 feet
Automated Test Environment
Control and program with built-in visual BASIC
- Operator interfaces
- Control JDI testers and other instruments (with GPIB)
- Data Logs, Reports, Spread Sheets
- Plots, Reports, Analysis
JDI Test Sets
Off-the-shelf DUT Boards for important technology groups
Often, users will create their own DUT boards and test programs for testing a part. But there are some technology groups for which JDi provides off-the-shelf solutions which include DUT board sets and test programs. This is because those groups can be complex, requiring a lot of DUT board electronics, and because many part families can be accommodated from single solutions. The form factor of the JDi test sets are suitable for bench top, air stream, oven, and radiation test.
Test Sets Available
- OpAmp / Comparator
- ADC
- DAC
- x16 Memory ( for SRAM / FLASH / SDRAM / non Volatile Memories / Logic Devices …)
- Power (Regulators, Power FET, … )
Advanced IC Test Family Boards
Designed for critical technology groups.
Analog
• OpAmps
• Comparators
• PWM (coming)
Mixed Signal
• ADC
• DAC
Memory
• SRAM
• FLASH
• SDRAM
• EEPROM
• Logic
Power
• LDO Regulators
• FETs
turn key
IC Test – Family Boards
Families
- OpAmp/Cmpr
- Mixed Signal (ADC/DAC)
- Memory (+ Dig & Logic ckts)
- Power
- Full Test: DC, ac, Functional
- Thermal Test: Air Stream, Oven (with extender card)
- Single, Dual, Quad package support
- Multi-Site
- Includes Test Software and Part Libraries
Production Test, Radiation Test, etc
User extensible libraries via simple part definition screens
